27 - 28 Mayıs 2010 - Bilkent Otel Ankara
Yarının
ileri teknolojilerini yaratırken, Agilent
Technologies – SPARK Ölçüm Teknolojileri Ltd. Şti. tasarım ve test
konularında size ihtiyacınız olan çözümleri sunuyor.
27-28 Mayıs tarihlerinde, Bilkent Otel’de düzenlenecek Savunma ve Havacılık Sempozyumuna
katılın ve Agilent Technologies’in savunma ve havacılık konularındaki yeni
çözümleri ve uygulamaları hakkında bilgi
sahibi olun.
Sunumlar, iletişim, uydu, radar ve anten ölçüm teknolojileri konu
başlıklarında olacaktır. Agilent Technologies ve SPARK Ölçüm
Teknolojileri Ltd. Şti. uzmanları iki gün boyunca yeni ürün ve çozümleri
sizlere tanıtmak ve ilgili sorularınıza cevap vermek üzere hazır
bulunacaklardır.
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Program:
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Perşembe
27 Mayıs 2010
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Cuma
28 Mayıs 2010
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0830 - 0900
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Kayıt
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0900 - 1000
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Technology Refresh – “To be or not to
be?” A
case-based look at the challenges, considerations and approaches for
legacy
test system migration
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Getting all
you deserve from today’s spectrum/signal analyzers
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1000 - 1015
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Kahve
Molası
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1015 - 1115
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Simulating and Testing Radar Systems
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Multiple
Domain Analysis for SDRs
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1115 - 1130
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Kahve
Molası
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1130 - 1230
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Developing
Customized Measurements and Analysis Routines for Aerospace/Defense
Systems
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RF Sensor
Networks For Improved Detection and Geolocation
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1230 - 1330
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Öğle
Yemeği
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1330 - 1430
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Advanced
Active Component Characterization Utilizing Nonlinear Vector Network
Analyzer
and X-parameters
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Dynamic Power
Analysis Techniques for Low Power Communication Design |
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1430 - 1445
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Kahve
Molası
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1445 - 1545
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Testing
modern pulsed radars using commercial instrumentation and software
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Testing
Regenerative payloads
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1545 - 1600
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Kahve
Molası
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1600 - 1700
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Coherent
Multi-Channel & Diversity Systems - Phase Coherency &
Stability
Between Multiple Signal Sources
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Solar Array
Simulation for Satellites
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Sunumlar:
1 - Technology Refresh – “To be or
not to be?” A case-based
look at the challenges, considerations and approaches for legacy test
system
migration
This
paper will look at various test system migration scenarios based on
recent
real-world experiences of some of Agilent’s customers in the Defense
Industry. The key attributes and
dynamics of each scenario will be explored: challenges and migration
risk
considerations, the business, operational and technical factors and the
corresponding pros and cons of the different possible approaches to
maintain,
upgrade or modernize the existing ATE. Recent new developments in highly
flexible and backwards-compatible test and measurement equipment will be
addressed. Included will be understanding the Cost of Test/Ownership
analysis
so that Return on Investment may be evaluated.
2 - Simulating and Testing Radar Systems
Modern radar systems working in an environment of strong clutter and jamming must use very advanced digital signal processing techniques. Direct analysis will not work when designing such a complex system. Although simulation is often used, most simulation tools do not have the right models or enough integration capability to complete the design. In this paper, a system design methodology is proposed using Agilent SystemVue. Examples will show how Digital Array Radar with Adaptive Beamforming and Pulse Doppler capability can be designed quickly using SystemVue and its suite of design tools. To ensure the design works properly, SystemVue integrates the design with test instruments for system characterization thus reducing development time.
3 - Developing
Customized Measurements and Analysis Routines for Aerospace/Defense
Systems
The
need to accurately characterise the linear and nonlinear performance of
high
frequency components, combined with a trend towards greater sub-system
integration, is changing the way RF and microwave devices are tested.
This
paper discusses these issues in more detail and how vector network
analysers
are adapting by adding a second internal signal generator and by
expanding the
number of test ports in the test system. Also discussed are advances in
VNA
calibration that ensure the accuracy associated with two-port
S-parameter
measurements is maintained
4 - Advanced
Active
Component Characterization Utilizing Nonlinear Vector Network Analyzer
and
X-parameters
This
presentation will focus on Nonlinear Vector Network Analyzer (NVNA)
measurements, which enable active device designers to accurately measure
and
model nonlinear device characteristics. Just as S-parameters have been successfully used to accurately
model
linear devices, X-parameters, which are relatively new, are used to
accurately
model the non-linear effects of active devices. This presentation will describe non-linear measurements,
X-parameters,
and the benefits they can provide, which include more accurate
simulation of
non-linear circuits and designs, shortened design times, reduced number
of
prototype turns, and faster time to market.
5 - Testing
modern
pulsed radars using commercial instrumentation and software
There
are a number of challenges in testing modern pulsed radars.Complex modulations, multiple coherent
emitters and wider bandwidths provide further challenges for high
performance
designs. This paper will review many of
the measurements that can be useful in testing pulsed radars, from basic
PRI
measurements through measurements on coherent, multichannel systems
utilizing
pulse compression. We will show the
capabilities and considerations of modern, commercial Spectrum (Signal)
Analyzers and Oscilloscopes in making these measurements.
6 - Coherent Multi-Channel
& Diversity Systems - Phase Coherency & Stability Between
Multiple
Signal Sources
When
performing characterization of a radar receiver design, a direction
finding
system or a diversity communication network, special signal
simulation capabilities are required
to accurately recreate the operational environment. This
paper will review the test signal
environment needed for the evaluation of these various types of modern
wireless
systems. It includes information on
building waveforms with an arbitrary waveform generator and how to
provide
synchronized, coherent stimulus to the different signal ports within the
system. Performance considerations in terms
of the signal source fidelity and spectral purity will be investigated.
7 - Getting all
you
deserve from today’s spectrum/signal analyzers
Spectrum
measurements are essential to RF/microwave testing, and newer analyzers
deliver
better performance and speed. New
“signal analyzers” also add vector capabilities such as precision
demodulation
and time domain analysis plus wideband capture/playback. With built-in measurement applications the
analyzers can streamline systems by making phase noise and noise figure
measurements, plus full pulse analysis. In many cases their performance is high enough to replace power
meters
and modulation analyzers.
This
presentation shows how to make the most of signal analyzers; how to
optimize
measurement quality and efficiency, how to take advantage of all the
analyzer
inputs & outputs and the wide array of automatic functions.
8
- Multiple Domain Analysis for
for SDRs
As
software define radio (SDR) designs drive more digital processing in
transceiver designs, it is more important than ever to be able to
analyze
multiple domains. Are IQ balance issues
affecting BER? Or are software issues
limiting RF performance? This paper
discusses the various advances in test and measurement equipment and how
these
capabilities can be applied to solving the challenges faced by SDR
transceiver
designers.
While
covering multiple test and measurement instruments, a focus will be
placed on
the ever increasing capabilities of the oscilloscopes that have allowed
them to
grow into a powerful multi-domain instrument.
9 - RF Sensor Networks For
Improved Detection and
Geolocation
Modern
radios are more efficient than their predecessors making the signals
they
transmit harder to detect using traditional approaches. This is
especially true
in urban areas where the RF environment is crowded, and signal
propagation is
complex.
This
paper explores the use and performance of RF sensor networks for
improved
detection, identification, and geo-location of modern signals using
coherent
detection, proximity gain, and time-difference of arrival.
10 - Dynamic Power Analysis
Techniques for Low
Power Communication Design
Capabilities and
features in portable military
communication equipment continue to advance at a rapid pace leading to
increased power supply needs. This makes
designing for low power critical because of considerations like battery
life,
equipment weight, and thermal management. In low power optimization the
main measurement challenge is
accurately
characterizing the sharp transients and dynamic nature of the design’s
current
profile.
In
this presentation we will discuss methods and tools available to
accurately
characterize dynamic current for low power optimization. We will cover
the pros and cons of these
methods as well as provide helpful tips on configuring equipment to
accurately
characterize the power needs of your design..
11- Testing Regenrative Payloads
Regenerative
payloads pose a variety of test
challenges not found in conventional analog bent-pipe testing. This
paper
explores the challenges of delivering a low bit error rate and the many
measurements needed to assure both availability of and quality of
service.
Learn how Agilent’s software tools, analyzers and cross- format analysis
capabilities can solve the challenges of delivering bits error free.
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- Solar Array Simulation for
Satellites
Satellite
EGSE system designers know that failure is not an option. Solar arrays,
which
provide power to satellite subsystems and charge internal batteries for
use
during eclipse, have unique I-V output power characteristics. The
environmental
conditions that cause performance fluctuations, such as temperature,
angle of
incidence, and light intensity, are difficult to replicate in a lab
environment. Agilent offers specially
developed power solutions to simulate the output curves of solar panels,
which
can be used on the ground to properly verify bus regulation techniques
before
launch.This presentation is targeted to
satellite integrators and especially power subsystem developers.
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